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Multiplex Fourier Spectroscopy in Reconstructing the Concentration Profile of the Near-Electrode Lay |
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20.09.2008 г. |
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Multiplex Fourier Spectroscopy in Reconstructing the Concentration Profile of the Near-Electrode Layer V. A. Kotenev Institute of Physical Chemistry, Russian Academy of Sciences,
Leninskii pr. 31, Moscow, 119991 Russia Received December 29, 2004 Abstract — A method of spectral multiplexing for a nondestructive monitoring of the refraction-index distribution throughout the volume of a nonuniform near-electrode layer at a metal–solution interface is considered. As shown, the amplitude-modulation Fourier spectroscopy of the reflection from a nonuniform near-surface layer, which has a low-gradient profile of complex refraction index and a weak dispersion of optical parameters, allows one to embody the multiplex principle of measurements and reproduce the refractive-index distribution and, hence, the concentration distribution over the depth of the near-electrode layer, based on either interference patterns or an additional Fourier transform.
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